Information card for entry 7038579
| Formula |
C40 H32 Cu N4 O3 P S |
| Calculated formula |
C40 H32 Cu N4 O3 P S |
| SMILES |
[Cu]12([P](c3ccccc3)(c3ccccc3)c3c(S(=O)(=O)O2)cccc3)[n]2c(nc(cc2C)c2ccccc2)c2[n]1c(cc(n2)c1ccccc1)C |
| Title of publication |
Neutral copper(i) complexes featuring phosphinesulfonate chelates. |
| Authors of publication |
Vazart, F.; Savel, P.; Latouche, C.; Barone, V.; Camerel, F.; Roisnel, T.; Fillaut, J.-L.; Akdas-Kilig, H; Achard, M. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2016 |
| Journal volume |
45 |
| Journal issue |
15 |
| Pages of publication |
6566 - 6573 |
| a |
32.0544 ± 0.0011 Å |
| b |
14.5116 ± 0.0006 Å |
| c |
18.9107 ± 0.0008 Å |
| α |
90° |
| β |
125.296 ± 0.001° |
| γ |
90° |
| Cell volume |
7179.5 ± 0.5 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0681 |
| Residual factor for significantly intense reflections |
0.0467 |
| Weighted residual factors for significantly intense reflections |
0.1096 |
| Weighted residual factors for all reflections included in the refinement |
0.1179 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.012 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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