Information card for entry 7038580
| Formula |
C40 H44 Cu2 O10 P2 S2 |
| Calculated formula |
C40 H44 Cu2 O10 P2 S2 |
| SMILES |
c1(ccccc1)[P]1(c2ccccc2)c2ccccc2S2(=[O][Cu]1(OS1(=[O][Cu]([P](c3ccccc3)(c3ccccc3)c3ccccc13)(O2)[OH]C)=O)[OH]C)=O.OC.CO |
| Title of publication |
Neutral copper(i) complexes featuring phosphinesulfonate chelates. |
| Authors of publication |
Vazart, F.; Savel, P.; Latouche, C.; Barone, V.; Camerel, F.; Roisnel, T.; Fillaut, J.-L.; Akdas-Kilig, H; Achard, M. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2016 |
| Journal volume |
45 |
| Journal issue |
15 |
| Pages of publication |
6566 - 6573 |
| a |
10.456 ± 0.0003 Å |
| b |
11.375 ± 0.0005 Å |
| c |
18.0053 ± 0.0008 Å |
| α |
90° |
| β |
106.129 ± 0.002° |
| γ |
90° |
| Cell volume |
2057.2 ± 0.14 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0591 |
| Residual factor for significantly intense reflections |
0.0409 |
| Weighted residual factors for significantly intense reflections |
0.0798 |
| Weighted residual factors for all reflections included in the refinement |
0.0865 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.001 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/7038580.html