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Information card for entry 7038580
Preview
Coordinates | 7038580.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H44 Cu2 O10 P2 S2 |
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Calculated formula | C40 H44 Cu2 O10 P2 S2 |
SMILES | c1(ccccc1)[P]1(c2ccccc2)c2ccccc2S2(=[O][Cu]1(OS1(=[O][Cu]([P](c3ccccc3)(c3ccccc3)c3ccccc13)(O2)[OH]C)=O)[OH]C)=O.OC.CO |
Title of publication | Neutral copper(i) complexes featuring phosphinesulfonate chelates. |
Authors of publication | Vazart, F.; Savel, P.; Latouche, C.; Barone, V.; Camerel, F.; Roisnel, T.; Fillaut, J.-L.; Akdas-Kilig, H; Achard, M. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 15 |
Pages of publication | 6566 - 6573 |
a | 10.456 ± 0.0003 Å |
b | 11.375 ± 0.0005 Å |
c | 18.0053 ± 0.0008 Å |
α | 90° |
β | 106.129 ± 0.002° |
γ | 90° |
Cell volume | 2057.2 ± 0.14 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0591 |
Residual factor for significantly intense reflections | 0.0409 |
Weighted residual factors for significantly intense reflections | 0.0798 |
Weighted residual factors for all reflections included in the refinement | 0.0865 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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