Information card for entry 7038691

Structure parameters

• Formula: C38 H94 F12 P10 Re2 Si2
• Calculated formula: C38 H94 F12 P10 Re2 Si2
• SMILES: C(#[Re](C#C[Si](C)(C)C)([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)[P](C)(C)C)CCC#[Re](C#C[Si](C)(C)C)([P](C)(C)C)([P](C)(C)C)([P](C)(C)C)[P](C)(C)C.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-]
• Title of publication: Electronic communication in phosphine substituted bridged dirhenium complexes - clarifying ambiguities raised by the redox non-innocence of the C4H2- and C4-bridges.
• Authors of publication: Li, Yan; Blacque, Olivier; Fox, Thomas; Luber, Sandra; Polit, Walther; Winter, Rainer F.; Venkatesan, Koushik; Berke, Heinz
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2016
• Journal volume: 45
• Journal issue: 13
• Pages of publication: 5783 - 5799
• a: 10.1955 ± 0.0002 Å
• b: 10.4458 ± 0.0001 Å
• c: 15.8038 ± 0.0003 Å
• α: 90.942 ± 0.001°
• β: 108.673 ± 0.001°
• γ: 91.938 ± 0.001°
• Cell volume: 1592.94 ± 0.05 ų
• Cell temperature: 183 ± 2 K
• Ambient diffraction temperature: 183 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0257
• Residual factor for significantly intense reflections: 0.0215
• Weighted residual factors for significantly intense reflections: 0.0497
• Weighted residual factors for all reflections included in the refinement: 0.0503
• Goodness-of-fit parameter for all reflections included in the refinement: 0.973
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No