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Information card for entry 7041772
Preview
Coordinates | 7041772.cif |
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Original paper (by DOI) | HTML |
Formula | C20 H26 Cl2 Si3 |
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Calculated formula | C20 H26 Cl2 Si3 |
SMILES | C(=C\[Si](C)(C)Cl)/[Si](c1ccccc1)(/C=C/[Si](C)(C)Cl)c1ccccc1 |
Title of publication | Fluoride complexation by bidentate silicon Lewis acids. |
Authors of publication | Horstmann, Jan; Niemann, Mark; Berthold, Katarína; Mix, Andreas; Neumann, Beate; Stammler, Hans-Georg; Mitzel, Norbert W. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2017 |
Journal volume | 46 |
Journal issue | 6 |
Pages of publication | 1898 - 1913 |
a | 17.3643 ± 0.0004 Å |
b | 11.5112 ± 0.0003 Å |
c | 11.442 ± 0.0003 Å |
α | 90° |
β | 90.416 ± 0.003° |
γ | 90° |
Cell volume | 2287.01 ± 0.1 Å3 |
Cell temperature | 100 ± 0.1 K |
Ambient diffraction temperature | 100 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0383 |
Residual factor for significantly intense reflections | 0.0323 |
Weighted residual factors for significantly intense reflections | 0.0826 |
Weighted residual factors for all reflections included in the refinement | 0.0848 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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