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Information card for entry 7041773
Preview
Coordinates | 7041773.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H90 F8 K2 N4 O12 Si3 |
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Calculated formula | C52 H90 F8 K2 N4 O12 Si3 |
Title of publication | Fluoride complexation by bidentate silicon Lewis acids. |
Authors of publication | Horstmann, Jan; Niemann, Mark; Berthold, Katarína; Mix, Andreas; Neumann, Beate; Stammler, Hans-Georg; Mitzel, Norbert W. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2017 |
Journal volume | 46 |
Journal issue | 6 |
Pages of publication | 1898 - 1913 |
a | 11.42848 ± 0.00016 Å |
b | 14.5458 ± 0.0002 Å |
c | 20.6353 ± 0.0003 Å |
α | 101.002 ± 0.0012° |
β | 99.0164 ± 0.0012° |
γ | 106.203 ± 0.0012° |
Cell volume | 3152.29 ± 0.08 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0321 |
Residual factor for significantly intense reflections | 0.0308 |
Weighted residual factors for significantly intense reflections | 0.0802 |
Weighted residual factors for all reflections included in the refinement | 0.0813 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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