Information card for entry 7041854
| Formula |
C22 H27 F3 N2 O3 S2 |
| Calculated formula |
C22 H27 F3 N2 O3 S2 |
| SMILES |
S(=O)(=O)([O-])C(F)(F)F.SC1=[N+](c2c(cc(cc2C)C)C)CCN1c1c(cc(cc1C)C)C |
| Title of publication |
N-Heterocyclic carbene stabilized parent sulfenyl, selenenyl, and tellurenyl cations (XH(+), X = S, Se, Te). |
| Authors of publication |
Liu, Liu Leo; Zhu, Diya; Cao, Levy L.; Stephan, Douglas W. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2017 |
| Journal volume |
46 |
| Journal issue |
10 |
| Pages of publication |
3095 - 3099 |
| a |
8.783 ± 0.013 Å |
| b |
16.48 ± 0.02 Å |
| c |
17.56 ± 0.02 Å |
| α |
73.04 ± 0.06° |
| β |
89.36 ± 0.05° |
| γ |
78.37 ± 0.04° |
| Cell volume |
2378 ± 5 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1027 |
| Residual factor for significantly intense reflections |
0.0639 |
| Weighted residual factors for significantly intense reflections |
0.1693 |
| Weighted residual factors for all reflections included in the refinement |
0.1885 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.058 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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