Information card for entry 7041853
| Formula |
C22 H27 F3 N2 O3 S Se |
| Calculated formula |
C22 H27 F3 N2 O3 S Se |
| SMILES |
S(=O)(=O)([O-])C(F)(F)F.[N+]1(c2c(cc(cc2C)C)C)=C(N(c2c(cc(cc2C)C)C)CC1)[SeH] |
| Title of publication |
N-Heterocyclic carbene stabilized parent sulfenyl, selenenyl, and tellurenyl cations (XH(+), X = S, Se, Te). |
| Authors of publication |
Liu, Liu Leo; Zhu, Diya; Cao, Levy L.; Stephan, Douglas W. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2017 |
| Journal volume |
46 |
| Journal issue |
10 |
| Pages of publication |
3095 - 3099 |
| a |
33.69 ± 0.004 Å |
| b |
8.5921 ± 0.0009 Å |
| c |
18.017 ± 0.002 Å |
| α |
90° |
| β |
110.24 ± 0.007° |
| γ |
90° |
| Cell volume |
4893.3 ± 1 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0686 |
| Residual factor for significantly intense reflections |
0.0455 |
| Weighted residual factors for significantly intense reflections |
0.1187 |
| Weighted residual factors for all reflections included in the refinement |
0.1305 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.199 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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