Information card for entry 7042951
| Formula |
C25 H41 B N2 Si |
| Calculated formula |
C25 H41 B N2 Si |
| SMILES |
[Si]1([N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C)(C1(C(=C(C(=C1C)C)C)C)C)[BH3] |
| Title of publication |
Reactivity studies of silylene [PhC(NtBu)2](C5Me5)Si - reactions with [M(COD)Cl]2 (M = Rh(i), Ir(i)), S, Se, Te, and BH3. |
| Authors of publication |
Kaufmann, Sebastian; Schäfer, Sebastian; Gamer, Michael T.; Roesky, Peter W. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2017 |
| a |
11.7919 ± 0.0006 Å |
| b |
15.7103 ± 0.0007 Å |
| c |
16.4582 ± 0.0008 Å |
| α |
113.744 ± 0.004° |
| β |
90.039 ± 0.004° |
| γ |
111.221 ± 0.004° |
| Cell volume |
2563 ± 0.3 Å3 |
| Cell temperature |
210 K |
| Ambient diffraction temperature |
210 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0646 |
| Residual factor for significantly intense reflections |
0.0441 |
| Weighted residual factors for significantly intense reflections |
0.1262 |
| Weighted residual factors for all reflections included in the refinement |
0.1324 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.993 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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