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Information card for entry 7103952
Preview
Coordinates | 7103952.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H64 Ga4 I8 O2 Si4 |
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Calculated formula | C40 H64 Ga4 I8 O2 Si4 |
SMILES | [C@]([Ga](I)I)(/C(C#C[Si](C)(C)C)=C(\C#C[Si](C)(C)C)[C@@]([Ga](I)(I)O[C](C)C)([Ga](I)I)[Si](C)(C)C)([Ga](I)(I)[O]=C(C)C)[Si](C)(C)C.c1(C)ccccc1.c1(ccccc1)C |
Title of publication | The reaction of "GaI" with a 1,3-diyne: synthesis, characterisation and reactivity of a novel C‒C coupled ene‒diyne‒bis(gem-organodigallium(III)) complex |
Authors of publication | Baker, Robert J.; Jones, Cameron |
Journal of publication | Chemical Communications (Cambridge, United Kingdom) |
Year of publication | 2003 |
Journal issue | 3 |
Pages of publication | 390 - 391 |
a | 11.973 ± 0.002 Å |
b | 22.496 ± 0.005 Å |
c | 11.547 ± 0.002 Å |
α | 90° |
β | 94.52 ± 0.03° |
γ | 90° |
Cell volume | 3100.4 ± 1.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0866 |
Residual factor for significantly intense reflections | 0.0642 |
Weighted residual factors for significantly intense reflections | 0.1532 |
Weighted residual factors for all reflections included in the refinement | 0.1645 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7103952.html
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