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Information card for entry 7105135
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Coordinates | 7105135.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Ti(N2NMe){NC(ArF)NNPh2}(py) |
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Formula | C35 H44 F5 N7 Si2 Ti |
Calculated formula | C35 H44 F5 N7 Si2 Ti |
SMILES | [Ti]12(=NC(=NN(c3ccccc3)c3ccccc3)c3c(c(c(c(c3F)F)F)F)F)(N(CC[N]2(CCN1[Si](C)(C)C)C)[Si](C)(C)C)[n]1ccccc1 |
Title of publication | Single and double substrate insertion into the Ti=N(alpha) bonds of terminal titanium hydrazides. |
Authors of publication | Tiong, Pei-Jen; Schofield, A Daniel; Selby, Jonathan D; Nova, Ainara; Clot, Eric; Mountford, Philip |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2009 |
Journal volume | 46 |
Journal issue | 1 |
Pages of publication | 85 - 87 |
a | 13.7067 ± 0.0002 Å |
b | 18.2074 ± 0.0002 Å |
c | 15.3084 ± 0.0002 Å |
α | 90° |
β | 93.8645 ± 0.0006° |
γ | 90° |
Cell volume | 3811.73 ± 0.09 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0426 |
Residual factor for significantly intense reflections | 0.0348 |
Weighted residual factors for all reflections | 0.0397 |
Weighted residual factors for significantly intense reflections | 0.0343 |
Weighted residual factors for all reflections included in the refinement | 0.0335 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1133 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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