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Information card for entry 7107946
Preview
Coordinates | 7107946.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H92 Si4 Sn2 Te4 |
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Calculated formula | C56 H92 Si4 Sn2 Te4 |
SMILES | [Si]([Te]1[Sn]([Te]([Si](C(C)(C)C)(C(C)(C)C)c2ccccc2)[Sn]1[Te][Si](C(C)(C)C)(C(C)(C)C)c1ccccc1)[Te][Si](C(C)(C)C)(C(C)(C)C)c1ccccc1)(C(C)(C)C)(C(C)(C)C)c1ccccc1 |
Title of publication | Cyclic and polycyclic tellurium-tin and tellurium-lead compounds ‒ synthesis, structures and thermal decomposition |
Authors of publication | Stephan Traut; Carsten von Hanisch; Alexander Peter Hahnel; Sven Stahl |
Journal of publication | Chem.Commun. |
Year of publication | 2012 |
Journal volume | 48 |
Pages of publication | 6984 |
a | 29.684 ± 0.003 Å |
b | 8.3463 ± 0.0005 Å |
c | 30.084 ± 0.003 Å |
α | 90° |
β | 118.768 ± 0.006° |
γ | 90° |
Cell volume | 6533.4 ± 1.1 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1948 |
Residual factor for significantly intense reflections | 0.0716 |
Weighted residual factors for significantly intense reflections | 0.0895 |
Weighted residual factors for all reflections included in the refinement | 0.123 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.815 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7107946.html
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