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Information card for entry 7107947
Preview
| Coordinates | 7107947.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H92 Pb2 Si4 Te4 |
|---|---|
| Calculated formula | C56 H92 Pb2 Si4 Te4 |
| SMILES | C(C)(C)(C)[Si](C(C)(C)C)(c1ccccc1)[Te][Pb]1[Te]([Pb]([Te]1[Si](C(C)(C)C)(C(C)(C)C)c1ccccc1)[Te][Si](C(C)(C)C)(C(C)(C)C)c1ccccc1)[Si](C(C)(C)C)(C(C)(C)C)c1ccccc1 |
| Title of publication | Cyclic and polycyclic tellurium-tin and tellurium-lead compounds ‒ synthesis, structures and thermal decomposition |
| Authors of publication | Stephan Traut; Carsten von Hanisch; Alexander Peter Hahnel; Sven Stahl |
| Journal of publication | Chem.Commun. |
| Year of publication | 2012 |
| Journal volume | 48 |
| Pages of publication | 6984 |
| a | 25.621 ± 0.007 Å |
| b | 8.172 ± 0.0016 Å |
| c | 31.76 ± 0.006 Å |
| α | 90° |
| β | 90.06 ± 0.03° |
| γ | 90° |
| Cell volume | 6650 ± 3 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0344 |
| Residual factor for significantly intense reflections | 0.0275 |
| Weighted residual factors for significantly intense reflections | 0.0673 |
| Weighted residual factors for all reflections included in the refinement | 0.0694 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.974 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7107947.html
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