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Information card for entry 7108095
Preview
Coordinates | 7108095.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C31 H34 Fe2 Ga N Si |
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Calculated formula | C31 H34 Fe2 Ga N Si |
SMILES | [Ga]12([N](Cc3c1cccc3)(C)C)[c]13[cH]4[Fe]56789%101([cH]4[cH]5[cH]36)[c]1([Si](C)(C)[c]34[cH]5[Fe]6%11%12%13%14%153([cH]5[cH]6[cH]4%11)[c]32[cH]%12[cH]%13[cH]%14[cH]%153)[cH]7[cH]8[cH]9[cH]%101 |
Title of publication | Ferrocenophanes with gallium and silicon as alternating bridges |
Authors of publication | Bidraha Bagh; Nora C. Breit; Joe B. Gilroy; Gabriele Schatte; Jens Muller |
Journal of publication | Chem.Commun. |
Year of publication | 2012 |
Journal volume | 48 |
Pages of publication | 7823 |
a | 27.7463 ± 0.0002 Å |
b | 11.3739 ± 0.0002 Å |
c | 17.6834 ± 0.0003 Å |
α | 90° |
β | 96.862 ± 0.0008° |
γ | 90° |
Cell volume | 5540.62 ± 0.14 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0611 |
Residual factor for significantly intense reflections | 0.0377 |
Weighted residual factors for significantly intense reflections | 0.0753 |
Weighted residual factors for all reflections included in the refinement | 0.0844 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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