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Information card for entry 7108096
Preview
Coordinates | 7108096.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H42 Fe2 Ga N Si2 |
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Calculated formula | C34 H42 Fe2 Ga N Si2 |
SMILES | [Fe]123456789[c]%10([cH]4[cH]3[cH]2[cH]1%10)[Ga]1([N](Cc2c1cc([Si](C)(C)C)cc2)(C)C)[c]12[cH]3[Fe]4%10%11%12%13%141([c]1([cH]4[cH]%10[cH]%11[cH]%121)[Si](C)(C)[c]15[cH]9[cH]8[cH]7[cH]61)[cH]3[cH]%13[cH]2%14 |
Title of publication | Ferrocenophanes with gallium and silicon as alternating bridges |
Authors of publication | Bidraha Bagh; Nora C. Breit; Joe B. Gilroy; Gabriele Schatte; Jens Muller |
Journal of publication | Chem.Commun. |
Year of publication | 2012 |
Journal volume | 48 |
Pages of publication | 7823 |
a | 9.633 ± 0.0001 Å |
b | 10.863 ± 0.0001 Å |
c | 31.849 ± 0.0004 Å |
α | 90° |
β | 99.995 ± 0.0006° |
γ | 90° |
Cell volume | 3282.2 ± 0.06 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.057 |
Residual factor for significantly intense reflections | 0.0353 |
Weighted residual factors for significantly intense reflections | 0.0722 |
Weighted residual factors for all reflections included in the refinement | 0.0806 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7108096.html
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