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Information card for entry 7110498
Preview
Coordinates | 7110498.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H48 N2 O4 Os P2 S2 Si |
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Calculated formula | C46 H48 N2 O4 Os P2 S2 Si |
SMILES | [Os]1([Si]23OCCN(CCO2)CCO3)([S]=C(S1)N(C)C)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)C#[O] |
Title of publication | The synthesis and crystal structure of the first metal-bound stannatrane complex Os(Sn[OCH2CH2]3N)(η2-S2CNMe2)(CO)(PPh3)2: structural comparisons with the analogous silatrane complex Os(Si[OCH2CH2]3N)(η2-S2CNMe2)(CO)(PPh3)2 |
Authors of publication | Rickard, Clifton E. F.; Roper, Warren R.; Woodman, Timothy J.; James Wright, L. |
Journal of publication | Chemical Communications |
Year of publication | 1999 |
Journal issue | 9 |
Pages of publication | 837 |
a | 19.9139 ± 0.0002 Å |
b | 9.9449 ± 0.0001 Å |
c | 22.2254 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4401.56 ± 0.07 Å3 |
Cell temperature | 203 ± 2 K |
Ambient diffraction temperature | 203 ± 2 K |
Number of distinct elements | 8 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0395 |
Residual factor for significantly intense reflections | 0.0346 |
Weighted residual factors for significantly intense reflections | 0.0737 |
Weighted residual factors for all reflections included in the refinement | 0.0762 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.173 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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