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Information card for entry 7111010
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Coordinates | 7111010.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [K{Me3SiNSi(SiMe3)(C6H4(NCH2tBu)2)}] |
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Formula | C22 H44 K N3 Si3 |
Calculated formula | C22 H44 K N3 Si3 |
SMILES | [K]N([Si]1([Si](C)(C)C)N(c2c(N1CC(C)(C)C)cccc2)CC(C)(C)C)[Si](C)(C)C |
Title of publication | The diverse reactions of the silylene Si[(NCH2But)2C6H4-1,2] with Li[Si(SiMe3)3](thf)3 and K[N(SiMe3)2] |
Authors of publication | Gehrhus, Barbara; Hitchcock, Peter B.; Lappert, Michael F.; Slootweg, J. Chris |
Journal of publication | Chemical Communications |
Year of publication | 2000 |
Journal issue | 15 |
Pages of publication | 1427 |
a | 13.4645 ± 0.0004 Å |
b | 12.7533 ± 0.0003 Å |
c | 16.5858 ± 0.0003 Å |
α | 90° |
β | 91.759 ± 0.002° |
γ | 90° |
Cell volume | 2846.72 ± 0.12 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0539 |
Residual factor for significantly intense reflections | 0.0391 |
Weighted residual factors for significantly intense reflections | 0.0904 |
Weighted residual factors for all reflections included in the refinement | 0.0972 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7111010.html
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Users of the data should acknowledge the original authors of the
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