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Information card for entry 7112678
Preview
| Coordinates | 7112678.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H21 N S2 W |
|---|---|
| Calculated formula | C22 H21 N S2 W |
| SMILES | [W]123456789(SC(=C(S1)c1ccccc1)C(C#N)(C)C)([cH]1[cH]5[cH]4[cH]3[cH]21)[cH]1[cH]6[cH]7[cH]8[cH]91 |
| Title of publication | A radical pathway to synthesise Mo and W dithiolene complexes. |
| Authors of publication | Tan, Ai Ling; Blake, Alexander J.; Davies, E. Stephen; Wilson, Claire; Garner, C. David |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2011 |
| Journal volume | 47 |
| Journal issue | 3 |
| Pages of publication | 953 - 954 |
| a | 11.6111 ± 0.0009 Å |
| b | 11.7045 ± 0.0009 Å |
| c | 14.583 ± 0.0012 Å |
| α | 90° |
| β | 95.084 ± 0.001° |
| γ | 90° |
| Cell volume | 1974.1 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0258 |
| Residual factor for significantly intense reflections | 0.0205 |
| Weighted residual factors for significantly intense reflections | 0.0462 |
| Weighted residual factors for all reflections included in the refinement | 0.0487 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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