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Information card for entry 7116597
Preview
Coordinates | 7116597.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H23 B Cl4 F4 N3 O3 Re |
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Calculated formula | C32 H23 B Cl4 F4 N3 O3 Re |
SMILES | [Re]1([n]2ccccc2c2[n]1c1c(cc2)c2c3ccccc3ccc2cc1)([n]1ccccc1)(C#[O])(C#[O])C#[O].C(Cl)Cl.C(Cl)Cl.[B](F)(F)(F)[F-] |
Title of publication | enantio-Enriched CPL-active helicene‒bipyridine‒rhenium complexes |
Authors of publication | Saleh, Nidal; Srebro, Monika; Reynaldo, Thibault; Vanthuyne, Nicolas; Toupet, Loïc; Chang, Victoria Y.; Muller, Gilles; Williams, J. A. Gareth; Roussel, Christian; Autschbach, Jochen; Crassous, Jeanne |
Journal of publication | Chemical Communications (Cambridge, United Kingdom) |
Year of publication | 2015 |
Journal volume | 51 |
Journal issue | 18 |
Pages of publication | 3754 - 3757 |
a | 10.854 ± 0.0002 Å |
b | 24.7778 ± 0.0003 Å |
c | 13.4316 ± 0.0002 Å |
α | 90° |
β | 110.589 ± 0.002° |
γ | 90° |
Cell volume | 3381.54 ± 0.1 Å3 |
Cell temperature | 140 ± 2 K |
Ambient diffraction temperature | 140 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0386 |
Residual factor for significantly intense reflections | 0.0249 |
Weighted residual factors for significantly intense reflections | 0.0616 |
Weighted residual factors for all reflections included in the refinement | 0.0647 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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