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Information card for entry 7119662
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Coordinates | 7119662.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (PPMeP)Cu(CbzI) |
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Formula | C37 H45 Cu I2 N P3 |
Calculated formula | C37 H45 Cu I2 N P3 |
SMILES | Ic1ccc2c(c1)c1c(n2[Cu]23[P](C(C)C)(c4ccccc4[P]3(c3ccccc3[P]2(C(C)C)C(C)C)C)C(C)C)ccc(I)c1 |
Title of publication | σ-Complexation as a strategy for designing copper-based light emitters. |
Authors of publication | Kim, Yeong-Eun; Kim, Jin; Park, Joon Woo; Park, Kiyoung; Lee, Yunho |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2017 |
Journal volume | 53 |
Journal issue | 19 |
Pages of publication | 2858 - 2861 |
a | 9.9922 ± 0.0007 Å |
b | 19.9115 ± 0.0013 Å |
c | 18.944 ± 0.0013 Å |
α | 90° |
β | 90.494 ± 0.002° |
γ | 90° |
Cell volume | 3769 ± 0.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0906 |
Residual factor for significantly intense reflections | 0.0518 |
Weighted residual factors for significantly intense reflections | 0.1145 |
Weighted residual factors for all reflections included in the refinement | 0.1321 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7119662.html
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