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Information card for entry 7119663
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Coordinates | 7119663.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (SiHP2)Cu(Cbz) |
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Formula | C43 H54 Cu N P2 Si |
Calculated formula | C43 H54 Cu N P2 Si |
SMILES | [Cu]12([P](c3c([Si](c4c([P]1(C(C)C)C(C)C)cccc4)(C)[H]2)cccc3)(C(C)C)C(C)C)n1c2c(c3c1cccc3)cccc2.c1ccccc1 |
Title of publication | σ-Complexation as a strategy for designing copper-based light emitters. |
Authors of publication | Kim, Yeong-Eun; Kim, Jin; Park, Joon Woo; Park, Kiyoung; Lee, Yunho |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2017 |
Journal volume | 53 |
Journal issue | 19 |
Pages of publication | 2858 - 2861 |
a | 18.7897 ± 0.0006 Å |
b | 19.9849 ± 0.0006 Å |
c | 21.0601 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7908.3 ± 0.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0957 |
Residual factor for significantly intense reflections | 0.0462 |
Weighted residual factors for significantly intense reflections | 0.108 |
Weighted residual factors for all reflections included in the refinement | 0.1353 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7119663.html
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Users of the data should acknowledge the original authors of the
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