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Information card for entry 7120497
Preview
| Coordinates | 7120497.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H44 N2 Pt S2 |
|---|---|
| Calculated formula | C36 H22 N2 Pt S2 |
| SMILES | c1c2c(cc3ccc4ccc5ccc6ccc7ccccc7c6c5c4c13)S[Pt]1([n]3c(c4cccc[n]14)cccc3)S2 |
| Title of publication | Triplet state CPL active helicene-dithiolene platinum bipyridine complexes |
| Authors of publication | Biet, Thomas; Cauchy, Thomas; Sun, Qinchao; Ding, Jie; Hauser, Andreas; Oulevey, Patric; Bürgi, Thomas; Jacquemin, Denis; Vanthuyne, Nicolas; Crassous, Jeanne; Avarvari, Narcis |
| Journal of publication | Chem. Commun. |
| Year of publication | 2017 |
| a | 21.1835 ± 0.0003 Å |
| b | 21.2582 ± 0.0003 Å |
| c | 27.7753 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 12507.9 ± 0.3 Å3 |
| Cell temperature | 150 ± 0.1 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0481 |
| Residual factor for significantly intense reflections | 0.0386 |
| Weighted residual factors for significantly intense reflections | 0.0924 |
| Weighted residual factors for all reflections included in the refinement | 0.1017 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7120497.html
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