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Information card for entry 7121066
Preview
| Coordinates | 7121066.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H15 Cl4 F6 Rh |
|---|---|
| Calculated formula | C22 H15 Cl4 F6 Rh |
| SMILES | [Rh]1234([c]5([c]1([c]2([c]3([c]45C)C)C)C)C)(c1c(F)c(Cl)c(F)c(Cl)c1F)c1c(F)c(Cl)c(F)c(Cl)c1F |
| Title of publication | Hidden aryl-exchange processes in stable 16e Rh<sup>III</sup> [RhCp*Ar<sub>2</sub>] complexes, and their unexpected transmetalation mechanism. |
| Authors of publication | Peñas-Defrutos, M N; Bartolomé, C; García-Melchor, M; Espinet, P. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2018 |
| Journal volume | 54 |
| Journal issue | 8 |
| Pages of publication | 984 - 987 |
| a | 8.6634 ± 0.0002 Å |
| b | 13.9649 ± 0.0004 Å |
| c | 19.5079 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2360.13 ± 0.11 Å3 |
| Cell temperature | 294 K |
| Ambient diffraction temperature | 294 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.042 |
| Residual factor for significantly intense reflections | 0.0311 |
| Weighted residual factors for significantly intense reflections | 0.0588 |
| Weighted residual factors for all reflections included in the refinement | 0.0651 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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