Information card for entry 7201440

Structure parameters

• Formula: C38 H46 S2 Si2
• Calculated formula: C38 H46 S2 Si2
• Title of publication: Thin-film morphology and transistor performance of alkyl-substituted triethylsilylethynyl anthradithiophenes
• Authors of publication: Anthony, John E.; Subramanian, Sankar; Parkin, Sean R.; Park, Sung Kyu; Jackson, Thomas N.
• Journal of publication: Journal of Materials Chemistry
• Year of publication: 2009
• Journal volume: 19
• Journal issue: 42
• Pages of publication: 7984
• a: 7.9028 ± 0.0003 Å
• b: 10.4873 ± 0.0004 Å
• c: 10.8412 ± 0.0005 Å
• α: 76.3218 ± 0.0018°
• β: 88.4391 ± 0.0017°
• γ: 88.963 ± 0.0019°
• Cell volume: 872.64 ± 0.06 ų
• Cell temperature: 150 ± 1 K
• Ambient diffraction temperature: 150 ± 1 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0844
• Residual factor for significantly intense reflections: 0.0542
• Weighted residual factors for significantly intense reflections: 0.1401
• Weighted residual factors for all reflections included in the refinement: 0.1585
• Goodness-of-fit parameter for all reflections included in the refinement: 1.043
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No