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Information card for entry 7202075
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Coordinates | 7202075.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Formula | C47 H34 Si |
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Calculated formula | C47 H34 Si |
SMILES | [Si]1(C(=C(C(=C1c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)(c1ccccc1)C1c2ccccc2c2ccccc12 |
Title of publication | Fluorenyl-substituted silole molecules: geometric, electronic, optical, and device properties |
Authors of publication | Zhan, Xiaowei; Haldi, Andreas; Risko, Chad; Chan, Calvin K.; Zhao, Wei; Timofeeva, Tatiana V.; Korlyukov, Aleksander; Antipin, Mikhail Yu.; Montgomery, Sarah; Thompson, Evans; An, Zesheng; Domercq, Benoit; Barlow, Stephen; Kahn, Antoine; Kippelen, Bernard; Brédas, Jean-Luc; Marder, Seth R. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2008 |
Journal volume | 18 |
Journal issue | 26 |
Pages of publication | 3157 |
a | 13.448 ± 0.004 Å |
b | 10.218 ± 0.002 Å |
c | 25.111 ± 0.006 Å |
α | 90° |
β | 97.34 ± 0.02° |
γ | 90° |
Cell volume | 3422.3 ± 1.5 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0683 |
Residual factor for significantly intense reflections | 0.0416 |
Weighted residual factors for significantly intense reflections | 0.095 |
Weighted residual factors for all reflections included in the refinement | 0.0998 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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