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Information card for entry 7203764
Preview
Coordinates | 7203764.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H64 N2 O6 |
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Calculated formula | C54 H64 N2 O6 |
SMILES | CCCCCCCCOc1c(cc(OCCCCCCCC)c(c1)C#Cc1cc2c(cc1)C(=O)N(C2=O)C1CCCCC1)C#Cc1cc2c(cc1)C(=O)N(C2=O)C1CCCCC1 |
Title of publication | Confined photoactive substructures on a chiral scaffold: the design of an electroluminescent polyimide as material for PLED** |
Authors of publication | Dautel, Olivier J.; Wantz, Guillaume; Flot, David; Lere-Porte, Jean-Pierre; Moreau, Joël J. E.; Parneix, Jean-Paul; Serein-Spirau, Françoise; Vignau, Laurence |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2005 |
Journal volume | 15 |
Journal issue | 41 |
Pages of publication | 4446 |
a | 5.254 ± 0.003 Å |
b | 14.407 ± 0.004 Å |
c | 16.82 ± 0.003 Å |
α | 112.813 ± 0.004° |
β | 90.92 ± 0.04° |
γ | 99.08 ± 0.07° |
Cell volume | 1154.7 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0691 |
Residual factor for significantly intense reflections | 0.0658 |
Weighted residual factors for significantly intense reflections | 0.1746 |
Weighted residual factors for all reflections included in the refinement | 0.1796 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.7305 Å |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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