Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7204283
Preview
Coordinates | 7204283.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H2 F12 N4 O6 Os2 |
---|---|
Calculated formula | C16 H2 F12 N4 O6 Os2 |
SMILES | C([Os]12(C#[O])(n3c(cc(C(F)(F)F)[n]3[Os]2(C#[O])(C#[O])(C#[O])n2c(cc(C(F)(F)F)[n]12)C(F)(F)F)C(F)(F)F)C#[O])#[O] |
Title of publication | Deposition of osmium thin films using pyrazolate complexes as CVD source reagents |
Authors of publication | Chi, Yun; Yu, Huan-Li; Ching, Wei-Li; Liu, Chao-Shiuan; Chen, Yao-Lun; Chou, Tsung-Yi; Peng, Shie-Ming; Lee, Gene-Hsiang |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2002 |
Journal volume | 12 |
Journal issue | 5 |
Pages of publication | 1363 |
a | 11.9181 ± 0.0002 Å |
b | 11.9181 ± 0.0002 Å |
c | 8.2009 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1164.86 ± 0.04 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 6 |
Space group number | 113 |
Hermann-Mauguin space group symbol | P -4 21 m |
Hall space group symbol | P -4 2ab |
Residual factor for all reflections | 0.0157 |
Residual factor for significantly intense reflections | 0.0146 |
Weighted residual factors for significantly intense reflections | 0.0363 |
Weighted residual factors for all reflections included in the refinement | 0.0365 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7204283.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.