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Information card for entry 7204283
Preview
| Coordinates | 7204283.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H2 F12 N4 O6 Os2 |
|---|---|
| Calculated formula | C16 H2 F12 N4 O6 Os2 |
| SMILES | C([Os]12(C#[O])(n3c(cc(C(F)(F)F)[n]3[Os]2(C#[O])(C#[O])(C#[O])n2c(cc(C(F)(F)F)[n]12)C(F)(F)F)C(F)(F)F)C#[O])#[O] |
| Title of publication | Deposition of osmium thin films using pyrazolate complexes as CVD source reagents |
| Authors of publication | Chi, Yun; Yu, Huan-Li; Ching, Wei-Li; Liu, Chao-Shiuan; Chen, Yao-Lun; Chou, Tsung-Yi; Peng, Shie-Ming; Lee, Gene-Hsiang |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2002 |
| Journal volume | 12 |
| Journal issue | 5 |
| Pages of publication | 1363 |
| a | 11.9181 ± 0.0002 Å |
| b | 11.9181 ± 0.0002 Å |
| c | 8.2009 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1164.86 ± 0.04 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 113 |
| Hermann-Mauguin space group symbol | P -4 21 m |
| Hall space group symbol | P -4 2ab |
| Residual factor for all reflections | 0.0157 |
| Residual factor for significantly intense reflections | 0.0146 |
| Weighted residual factors for significantly intense reflections | 0.0363 |
| Weighted residual factors for all reflections included in the refinement | 0.0365 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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