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Information card for entry 7204769
Preview
Coordinates | 7204769.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Tolan Perfluorotolan 1:1 molecular complex |
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Formula | C28 H10 F10 |
Calculated formula | C28 H10 F10 |
SMILES | c1ccc(C#Cc2ccccc2)cc1.c1(c(F)c(F)c(c(F)c1F)C#Cc1c(c(c(F)c(F)c1F)F)F)F |
Title of publication | Arene-perfluoroarene interactions in crystal engineering: structural preferences in polyfluorinated tolansArene?perfluoroarene interactions in crystal engineering. Part 9. Presented in part at the 16th International Symposium on Fluorine Chemistry, University of Durham, 2000. Abstract 1P-102. For part 8 see ref. 1.Electronic supplementary information (ESI) available: spectroscopic characterisation for 4b?k; plots of energy as a function of inter-ring torsion angle in 1,2,3,4,5-pentafluorotolan and as a function of C(Ph)?C(Ph)?O?C(Me) torsion angle in PhOMe. See http://www.rsc.org/suppdata/jm/b3/b314094f/ |
Authors of publication | Smith, Caroline E.; Smith, Philip S.; Thomas, Rhodri Ll.; Robins, Edward G.; Collings, Jonathan C.; Dai, Chaoyang; Scott, Andrew J.; Borwick, Simon; Batsanov, Andrei S.; Watt, Stephen W.; Clark, Stewart J.; Viney, Christopher; Howard, Judith A. K.; Clegg, William; Marder, Todd B. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2004 |
Journal volume | 14 |
Journal issue | 3 |
Pages of publication | 413 |
a | 6.0939 ± 0.0013 Å |
b | 7.5286 ± 0.0015 Å |
c | 12.491 ± 0.003 Å |
α | 85.554 ± 0.006° |
β | 86.479 ± 0.006° |
γ | 84.095 ± 0.006° |
Cell volume | 567.5 ± 0.2 Å3 |
Cell temperature | 160 ± 2 K |
Ambient diffraction temperature | 160 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0961 |
Residual factor for significantly intense reflections | 0.0675 |
Weighted residual factors for all reflections | 0.1782 |
Weighted residual factors for all reflections included in the refinement | 0.164 |
Goodness-of-fit parameter for all reflections | 0.947 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.128 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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