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Information card for entry 7204874
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Coordinates | 7204874.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Common name | tetrakis-(4-cyanophenyl)methane |
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Chemical name | tetrakis-(4-cyanophenyl)methane |
Formula | C29 H16 N4 |
Calculated formula | C29 H16 N4 |
SMILES | C(c1ccc(cc1)C#N)(c1ccc(cc1)C#N)(c1ccc(cc1)C#N)c1ccc(cc1)C#N |
Title of publication | Host?guest and network structures of some tetraphenylmethane derivativesElectronic supplementary information (ESI) available: ORTEP diagrams of the compounds in this study; structure solution and refinement details for (TCTPM)�(MeCN)0.5. See http://www.rsc.org/suppdata/ce/b4/b403858b/ |
Authors of publication | Basavoju, Srinivas; Aitipamula, Srinivasulu; Desiraju, Gautam R. |
Journal of publication | CrystEngComm |
Year of publication | 2004 |
Journal volume | 6 |
Journal issue | 25 |
Pages of publication | 120 |
a | 9.782 ± 0.001 Å |
b | 11.907 ± 0.002 Å |
c | 20.242 ± 0.003 Å |
α | 90° |
β | 98.13 ± 0.01° |
γ | 90° |
Cell volume | 2334 ± 0.6 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1517 |
Residual factor for significantly intense reflections | 0.0664 |
Weighted residual factors for significantly intense reflections | 0.0857 |
Weighted residual factors for all reflections included in the refinement | 0.1332 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.35 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7204874.html
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