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Information card for entry 7204875
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Coordinates | 7204875.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Common name | tetrakis-(4-cyanophenyl)methane-MeCN |
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Chemical name | tetrakis-(4-cyanophenyl)methane-MeCN |
Formula | C29 H16 N4 |
Calculated formula | C29 H16 N4 |
SMILES | N#Cc1ccc(C(c2ccc(cc2)C#N)(c2ccc(cc2)C#N)c2ccc(cc2)C#N)cc1 |
Title of publication | Host?guest and network structures of some tetraphenylmethane derivativesElectronic supplementary information (ESI) available: ORTEP diagrams of the compounds in this study; structure solution and refinement details for (TCTPM)�(MeCN)0.5. See http://www.rsc.org/suppdata/ce/b4/b403858b/ |
Authors of publication | Basavoju, Srinivas; Aitipamula, Srinivasulu; Desiraju, Gautam R. |
Journal of publication | CrystEngComm |
Year of publication | 2004 |
Journal volume | 6 |
Journal issue | 25 |
Pages of publication | 120 |
a | 15.413 ± 0.003 Å |
b | 17.607 ± 0.003 Å |
c | 18.504 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5021.6 ± 1.5 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 3 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.1201 |
Residual factor for significantly intense reflections | 0.0687 |
Weighted residual factors for significantly intense reflections | 0.155 |
Weighted residual factors for all reflections included in the refinement | 0.1766 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.97 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7204875.html
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