Information card for entry 7206470

Structure parameters

• Formula: O Sn
• Calculated formula: O Sn
• Title of publication: Shape-controlled growth and single-crystal XRD study of submillimeter-sized single crystals of SnO
• Authors of publication: Guo, Y. Q.; Tan, R. Q.; Li, X.; Zhao, J. H.; Luo, Z. L.; Gao, C.; Song, W. J.
• Journal of publication: CrystEngComm
• Year of publication: 2011
• Journal volume: 13
• Journal issue: 19
• Pages of publication: 5677
• a: 3.8494 ± 0.0019 Å
• b: 3.8494 ± 0.0019 Å
• c: 4.894 ± 0.005 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 72.52 ± 0.09 ų
• Cell temperature: 296 ± 2 K
• Ambient diffraction temperature: 296 ± 2 K
• Number of distinct elements: 2
• Space group number: 129
• Hermann-Mauguin space group symbol: P 4/n m m :2
• Hall space group symbol: -P 4a 2a
• Residual factor for all reflections: 0.0449
• Residual factor for significantly intense reflections: 0.0449
• Weighted residual factors for significantly intense reflections: 0.0966
• Weighted residual factors for all reflections included in the refinement: 0.0966
• Goodness-of-fit parameter for all reflections included in the refinement: 1.407
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No