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Information card for entry 7208934
Preview
Coordinates | 7208934.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C120 H208 Ce4 N60 O92 |
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Calculated formula | C120 H144 Ce4 N60 O76 |
SMILES | C12=[O][Ce]34([O]=C5N6CN2C27C8(N1CN1C(=O)N9CN%10C(=O)N%11CN%12C(=O)N%13CN%14C(N%15CN5C5%16C6(N6CN2C2N8CN8C%171C9(CCCC%17)N(CN1C9%10C%11(CCCC9)N(CN9C%10%12C%13(CCCC%10)N%10CN%11C%12%14C%15(CCCC%12)N(CN5C6=[O][Ce]([O]=2)([O]=C2N5CN6C%12%13C%14(N%15CN%17C%18N%19CN%20C%21=[O][Ce]%22([O]=%18)([O]=C%15N%13CN%13C(=O)N%15C%18(C5%13CCCC%18)N2CN2C5%13C%18(CCCC5)N(C(=O)N%13C%15)CN5C(=O)N%13C%15%23C5(CCCC%15)N(CN%18C2=O)C(=O)N%23CN2C5(C%20(N%15C2=[O][Ce]([O]=C2N(C%15)C%15%19C%17(N2CN%14C6=O)CCCC%15)([O]=C9%10)([OH2])([OH2])([OH2])([OH2])[OH2])CCCC5)N%21C%13)(ON(=O)=O)([O]=N(=O)O%22)([OH2])([OH2])[OH2])CCCC%12)([OH2])([OH2])([OH2])([OH2])[OH2])C%11=O)C1=O)C8=O)CCCC%16)O3)CCCC7)(ON(=O)=O)([OH2])(ON(=[O]4)=O)([OH2])[OH2].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-] |
Title of publication | Macrocycle-based metal ion complexation: a study of the lanthanide contraction effect towards hexacyclohexanocucurbit[6]uil |
Authors of publication | Qin, Xiao; Ni, Xin-Long; Hu, Jing-Xu; Chen, Kai; Zhang, Yun-Qian; Redshaw, Carl; Zhu, Qian-Jiang; Xue, Sai-Feng; Tao, Zhu |
Journal of publication | CrystEngComm |
Year of publication | 2013 |
Journal volume | 15 |
Journal issue | 4 |
Pages of publication | 738 |
a | 15.5784 ± 0.0009 Å |
b | 15.6145 ± 0.0009 Å |
c | 20.8875 ± 0.0017 Å |
α | 104.115 ± 0.003° |
β | 95.999 ± 0.003° |
γ | 119.254 ± 0.002° |
Cell volume | 4146.1 ± 0.5 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0483 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for significantly intense reflections | 0.1173 |
Weighted residual factors for all reflections included in the refinement | 0.1204 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7208934.html
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Users of the data should acknowledge the original authors of the
structural data.