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Information card for entry 7208935
Preview
Coordinates | 7208935.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C120 H212 La4 N60 O94 |
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Calculated formula | C120 H144 La4 N60 O76 |
SMILES | C12N3C45C6(N1CN1C7N8C9%10C1(N1CN6C6N4CN4C%11%12C%13(CCCC%11)N(CN%11C(=O)N%14CN%15C(=O)N%16CN%17C(N(C8)C8%18CCCCC%17%18N%17C(=O)N8CN9C1=[O][La]([O]=6)([OH2])([OH2])([OH2])([OH2])([OH2])[O]=C1N6CN8C9%18C%19(N%20CN%21C%22N%23CN%24C%25N%26C%27%28C%24(N%24C(N%27CN%27C%29%30C%31(CCCC%29)N(CN%29C(=O)N%32CN%33C(=O)N(CN%18C%20=[O][La]%18([O]=%25)([O]=%22)(ON(=O)=O)(ON(=[O]%18)=O)([OH2])([OH2])[OH2])C%186C%33(CCCC%18)N1CN1C6%32C%29(CCCC6)N(C1=O)CN%31C%27=O)C(=O)N%30C%26)=[O][La]([O]=C1N(C%24)C6%23C%21(N1CN%19C8=O)CCCC6)([O]=C1N(C%17)C6%16C%15(CCCC6)N1CN1C6%14C%11(CCCC6)N(CN%13C4=O)C1=O)([OH2])([OH2])([OH2])([OH2])[OH2])CCCC%28)CCCC9)=[O][La]1([O]=2)([O]=7)(ON(=O)=O)(ON(=[O]1)=O)([OH2])([OH2])[OH2])C(=O)N%12C3)CCCC%10)CCCC5.N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-] |
Title of publication | Macrocycle-based metal ion complexation: a study of the lanthanide contraction effect towards hexacyclohexanocucurbit[6]uil |
Authors of publication | Qin, Xiao; Ni, Xin-Long; Hu, Jing-Xu; Chen, Kai; Zhang, Yun-Qian; Redshaw, Carl; Zhu, Qian-Jiang; Xue, Sai-Feng; Tao, Zhu |
Journal of publication | CrystEngComm |
Year of publication | 2013 |
Journal volume | 15 |
Journal issue | 4 |
Pages of publication | 738 |
a | 15.5568 ± 0.0018 Å |
b | 15.6496 ± 0.0019 Å |
c | 21.03 ± 0.002 Å |
α | 104.42 ± 0.004° |
β | 95.91 ± 0.004° |
γ | 119.074 ± 0.004° |
Cell volume | 4179.3 ± 0.8 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.084 |
Residual factor for significantly intense reflections | 0.0765 |
Weighted residual factors for significantly intense reflections | 0.1871 |
Weighted residual factors for all reflections included in the refinement | 0.1907 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7208935.html
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Users of the data should acknowledge the original authors of the
structural data.