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Information card for entry 7213108
Preview
Coordinates | 7213108.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 3,3'''''-bis(butylthio)-2,2':5,,2'':5'',2''':5''',2'''':5'''',2'''''- -sexithiophene |
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Formula | C32 H30 S8 |
Calculated formula | C32 H30 S8 |
SMILES | c1(c2ccc(c3sc(cc3)c3ccc(c4ccc(c5c(ccs5)SCCCC)s4)s3)s2)sccc1SCCCC |
Title of publication | Synthesis, structural characterization and electronic properties of 3,3″″′-bis(butylsulfanyl)-2,2′∶5′,2″∶5″,2‴∶5‴,2″″∶5″″,2‴″-sexithiophene |
Authors of publication | Antolini, Luciano; Borsari, Marco; Goldoni, Francesca; Iarossi, Dario; Mucci, Adele; Schenetti, Luisa |
Journal of publication | Journal of the Chemical Society, Perkin Transactions 1 |
Year of publication | 1999 |
Journal issue | 21 |
Pages of publication | 3207 |
a | 13.684 ± 0.002 Å |
b | 5.827 ± 0.001 Å |
c | 20.132 ± 0.003 Å |
α | 90 ± 0.02° |
β | 91.76 ± 0.02° |
γ | 90 ± 0.02° |
Cell volume | 1604.5 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.1109 |
Residual factor for significantly intense reflections | 0.054 |
Weighted residual factors for all reflections | 0.1759 |
Weighted residual factors for significantly intense reflections | 0.1482 |
Goodness-of-fit parameter for all reflections | 0.979 |
Goodness-of-fit parameter for significantly intense reflections | 1.152 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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