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Information card for entry 7216040
Preview
Coordinates | 7216040.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H34 Cl2 N12 Ni O2 |
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Calculated formula | C42 H34 Cl2 N12 Ni O2 |
SMILES | c12ccccc1[nH]c1[n]2[Ni]23([n]4c5ccccc5[nH]c4c4[nH]c5ccccc5[n]24)([n]2c1[nH]c1ccccc21)[n]1c2ccccc2[nH]c1c1[n]3c2ccccc2[nH]1.O.[Cl-].[Cl-].O |
Title of publication | Guest dependent dielectric properties of nickel(ii)-based supramolecular networks |
Authors of publication | Mendiratta, Shruti; Usman, Muhammad; Luo, Tzuoo-Tsair; Lee, Shang-Fan; Lin, Ying-Chih; Lu, Kuang-Lieh |
Journal of publication | CrystEngComm |
Year of publication | 2014 |
Journal volume | 16 |
Journal issue | 28 |
Pages of publication | 6309 |
a | 12.2568 ± 0.0002 Å |
b | 15.712 ± 0.0003 Å |
c | 20.7876 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4003.25 ± 0.13 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P n a b |
Hall space group symbol | -P 2bc 2n |
Residual factor for all reflections | 0.0548 |
Residual factor for significantly intense reflections | 0.0422 |
Weighted residual factors for significantly intense reflections | 0.1205 |
Weighted residual factors for all reflections included in the refinement | 0.1306 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.134 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7216040.html
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