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Information card for entry 7219658
Preview
Coordinates | 7219658.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 1-(4-nitrophenyl)-3-phenylthiourea TMA CL |
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Chemical name | 1-(4-nitrophenyl)-3-phenylthiourea TMA CL |
Formula | C30 H34 Cl N7 O4 S2 |
Calculated formula | C30 H34 Cl N7 O4 S2 |
SMILES | c1(ccc(cc1)NC(=S)Nc1ccccc1)N(=O)=O.c1(ccc(cc1)NC(=S)Nc1ccccc1)N(=O)=O.C[N+](C)(C)C.[Cl-] |
Title of publication | Electron density distribution studies as a tool to explore the behaviour of thiourea-based anion receptors |
Authors of publication | Kirby, Isabelle L.; Pitak, Mateusz B.; Wilson, Claire; Gale, Philip A.; Coles, Simon J. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 14 |
Pages of publication | 2815 |
a | 9.1587 ± 0.0014 Å |
b | 10.2436 ± 0.0016 Å |
c | 17.871 ± 0.003 Å |
α | 87.983 ± 0.006° |
β | 79.043 ± 0.005° |
γ | 72.22 ± 0.006° |
Cell volume | 1567 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0341 |
Residual factor for significantly intense reflections | 0.0336 |
Weighted residual factors for significantly intense reflections | 0.1082 |
Weighted residual factors for all reflections included in the refinement | 0.1088 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.289 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7219658.html
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Users of the data should acknowledge the original authors of the
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