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Information card for entry 7219659
Preview
Coordinates | 7219659.cif |
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Original paper (by DOI) | HTML |
Common name | 1,3-bis(4-nitrophenyl)thiourea TEA CL |
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Formula | C34 H40 Cl N9 O8 S2 |
Calculated formula | C34 H40 Cl N9 O8 S2 |
SMILES | C(C)[N+](CC)(CC)CC.c1(ccc(cc1)NC(=S)Nc1ccc(cc1)N(=O)=O)N(=O)=O.[Cl-].c1(ccc(cc1)NC(=S)Nc1ccc(cc1)N(=O)=O)N(=O)=O |
Title of publication | Electron density distribution studies as a tool to explore the behaviour of thiourea-based anion receptors |
Authors of publication | Kirby, Isabelle L.; Pitak, Mateusz B.; Wilson, Claire; Gale, Philip A.; Coles, Simon J. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 14 |
Pages of publication | 2815 |
a | 8.968 ± 0.002 Å |
b | 15.649 ± 0.004 Å |
c | 15.899 ± 0.004 Å |
α | 113.061 ± 0.001° |
β | 103.685 ± 0.003° |
γ | 101.701 ± 0.002° |
Cell volume | 1882.6 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0444 |
Residual factor for significantly intense reflections | 0.0436 |
Weighted residual factors for significantly intense reflections | 0.1371 |
Weighted residual factors for all reflections included in the refinement | 0.1377 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.632 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7219659.html
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Users of the data should acknowledge the original authors of the
structural data.