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Information card for entry 7227723
Preview
| Coordinates | 7227723.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C46 H34 N8 |
|---|---|
| Calculated formula | C46 H34 N8 |
| SMILES | n1nn(c(c2ccccc2c2nnn(c2)c2ccc(N(c3ccccc3)c3ccccc3)cc2)c1)c1ccc(N(c2ccccc2)c2ccccc2)cc1 |
| Title of publication | Functional organic click-materials: application in phosphorescent organic light emitting diodes |
| Authors of publication | Kautny, Paul; Zhao, Chenyang; Kader, Thomas; Stöger, Berthold; Horkel, Ernst; Chen, Jiangshan; Ma, Dongge; Fröhlich, Johannes; Lumpi, Daniel |
| Journal of publication | RSC Adv. |
| Year of publication | 2017 |
| Journal volume | 7 |
| Journal issue | 20 |
| Pages of publication | 12150 |
| a | 8.9444 ± 0.001 Å |
| b | 13.9122 ± 0.0015 Å |
| c | 16.3529 ± 0.0018 Å |
| α | 77.14 ± 0.004° |
| β | 78.37 ± 0.004° |
| γ | 74.165 ± 0.004° |
| Cell volume | 1886.9 ± 0.4 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.075 |
| Residual factor for significantly intense reflections | 0.0472 |
| Weighted residual factors for significantly intense reflections | 0.0561 |
| Weighted residual factors for all reflections included in the refinement | 0.0581 |
| Goodness-of-fit parameter for significantly intense reflections | 2.58 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.17 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7227723.html
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Users of the data should acknowledge the original authors of the
structural data.