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Information card for entry 7228749
Preview
Coordinates | 7228749.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C63 H48 Er O7 P |
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Calculated formula | C63 H48 Er O7 P |
SMILES | [Er]123([O]=C(c4ccccc4)C=C(O1)c1ccccc1)([O]=C(c1ccccc1)C=C(O3)c1ccccc1)([O]=P(c1ccccc1)(c1ccccc1)c1ccccc1)[O]=C(c1ccccc1)C=C(O2)c1ccccc1 |
Title of publication | Near infrared organic light emitting devices based on a new erbium(iii) β-diketonate complex: synthesis and optoelectronic investigations |
Authors of publication | Ahmed, Zubair; Aderne, Rian E.; Kai, Jiang; Resende, Jackson A. L. C.; Padilla-Chavarría, Helmut I.; Cremona, Marco |
Journal of publication | RSC Adv. |
Year of publication | 2017 |
Journal volume | 7 |
Journal issue | 30 |
Pages of publication | 18239 |
a | 11.4558 ± 0.0005 Å |
b | 12.2566 ± 0.0005 Å |
c | 18.7593 ± 0.0008 Å |
α | 87.5699 ± 0.0013° |
β | 84.3897 ± 0.0014° |
γ | 77.4603 ± 0.0013° |
Cell volume | 2558.22 ± 0.19 Å3 |
Cell temperature | 294 ± 2 K |
Ambient diffraction temperature | 294.07 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0427 |
Residual factor for significantly intense reflections | 0.0288 |
Weighted residual factors for significantly intense reflections | 0.0552 |
Weighted residual factors for all reflections included in the refinement | 0.0593 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7228749.html
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