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Information card for entry 7229633
Preview
Coordinates | 7229633.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H16 N4 |
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Calculated formula | C21 H16 N4 |
SMILES | n1(c2ccccc2c2cc(ccc12)C(=C(C#N)C#N)C#N)CCCC |
Title of publication | Solid-state organization of n-type carbazole-based semiconductors for organic thin-film transistors. |
Authors of publication | Reig, Marta; Puigdollers, Joaquim; Velasco, Dolores |
Journal of publication | Physical chemistry chemical physics : PCCP |
Year of publication | 2018 |
Journal volume | 20 |
Journal issue | 2 |
Pages of publication | 1142 - 1149 |
a | 8.7842 ± 0.0007 Å |
b | 24.486 ± 0.002 Å |
c | 8.1096 ± 0.0008 Å |
α | 90° |
β | 110.652 ± 0.003° |
γ | 90° |
Cell volume | 1632.2 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.13 |
Residual factor for significantly intense reflections | 0.0565 |
Weighted residual factors for significantly intense reflections | 0.1194 |
Weighted residual factors for all reflections included in the refinement | 0.1492 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7229633.html
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structural data.