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Information card for entry 7229634
Preview
Coordinates | 7229634.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C29 H32 N4 |
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Calculated formula | C29 H32 N4 |
SMILES | N#CC(=C(C#N)c1ccc2n(c3c(c2c1)cccc3)CCCCCCCCCCCC)C#N |
Title of publication | Solid-state organization of n-type carbazole-based semiconductors for organic thin-film transistors. |
Authors of publication | Reig, Marta; Puigdollers, Joaquim; Velasco, Dolores |
Journal of publication | Physical chemistry chemical physics : PCCP |
Year of publication | 2018 |
Journal volume | 20 |
Journal issue | 2 |
Pages of publication | 1142 - 1149 |
a | 7.7023 ± 0.0013 Å |
b | 8.911 ± 0.0015 Å |
c | 20.022 ± 0.004 Å |
α | 77.669 ± 0.009° |
β | 84.775 ± 0.008° |
γ | 73.953 ± 0.007° |
Cell volume | 1289.4 ± 0.4 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1773 |
Residual factor for significantly intense reflections | 0.0644 |
Weighted residual factors for significantly intense reflections | 0.1438 |
Weighted residual factors for all reflections included in the refinement | 0.1812 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7229634.html
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Users of the data should acknowledge the original authors of the
structural data.