Information card for entry 7237324
| Formula |
C51 H37 Cl3 N2 O2 S |
| Calculated formula |
C51 H37 Cl3 N2 O2 S |
| Title of publication |
Sulfur-bridged tetraphenylethylene AIEgens for deep-blue organic light-emitting diodes |
| Authors of publication |
Cai, Yuanjing; Shi, Changsheng; Zhang, Han; Chen, Bin; Samedov, Kerim; Chen, Ming; Wang, Zhiming; Zhao, Zujin; Gu, Xinggui; Ma, Dongge; Qin, Anjun; Tang, Ben Zhong |
| Journal of publication |
Journal of Materials Chemistry C |
| Year of publication |
2018 |
| Journal volume |
6 |
| Journal issue |
24 |
| Pages of publication |
6534 |
| a |
15.9689 ± 0.0004 Å |
| b |
28.4291 ± 0.0004 Å |
| c |
9.49878 ± 0.00019 Å |
| α |
90° |
| β |
106.722 ± 0.002° |
| γ |
90° |
| Cell volume |
4129.91 ± 0.15 Å3 |
| Cell temperature |
99.98 ± 0.1 K |
| Ambient diffraction temperature |
99.98 ± 0.1 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0606 |
| Residual factor for significantly intense reflections |
0.0478 |
| Weighted residual factors for significantly intense reflections |
0.1297 |
| Weighted residual factors for all reflections included in the refinement |
0.1399 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7237324.html