Information card for entry 7237325
| Formula |
C50 H32 N2 S |
| Calculated formula |
C50 H32 N2 S |
| Title of publication |
Sulfur-bridged tetraphenylethylene AIEgens for deep-blue organic light-emitting diodes |
| Authors of publication |
Cai, Yuanjing; Shi, Changsheng; Zhang, Han; Chen, Bin; Samedov, Kerim; Chen, Ming; Wang, Zhiming; Zhao, Zujin; Gu, Xinggui; Ma, Dongge; Qin, Anjun; Tang, Ben Zhong |
| Journal of publication |
Journal of Materials Chemistry C |
| Year of publication |
2018 |
| Journal volume |
6 |
| Journal issue |
24 |
| Pages of publication |
6534 |
| a |
10.2848 ± 0.0006 Å |
| b |
9.012 ± 0.0005 Å |
| c |
19.3052 ± 0.0011 Å |
| α |
90° |
| β |
91.856 ± 0.005° |
| γ |
90° |
| Cell volume |
1788.39 ± 0.18 Å3 |
| Cell temperature |
100 ± 0.1 K |
| Ambient diffraction temperature |
100 ± 0.1 K |
| Number of distinct elements |
4 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0683 |
| Residual factor for significantly intense reflections |
0.0543 |
| Weighted residual factors for significantly intense reflections |
0.1306 |
| Weighted residual factors for all reflections included in the refinement |
0.1409 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.001 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7237325.html