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Information card for entry 7244210
Preview
Coordinates | 7244210.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C10 H25 Cl2 Cr F6 N5 P |
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Calculated formula | C10 H25 Cl2 Cr F6 N5 P |
Title of publication | Expanding and quantifying the crystal chemistry of the flexible ligand 15aneN5 |
Authors of publication | Shircliff, Anthony D.; Allbritton, Elisabeth M. A.; Davilla, Dustin J.; Gorbet, Michael-Joseph; Jones, Donald G.; Tresp, David S.; Allen, Michael B.; Shrestha, Alina; Burgess, Gwendolyn E.; Eze, John I.; Fernandez, Andrea T.; Ramirez, Daniel; Shoff, Kody J.; Crispin, Garet G.; Crone, Sarah B.; Flinn, Michael; Tran, Tien; Bryce, Darby S.; Bond, Abbagale L.; Shockey, Dylan W.; Oliver, Allen G.; Krause, Jeanette A.; Prior, Timothy J.; Hubin, Timothy J. |
Journal of publication | CrystEngComm |
Year of publication | 2022 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1218 - 1236 |
a | 9.0957 ± 0.0008 Å |
b | 9.2333 ± 0.0009 Å |
c | 22.464 ± 0.002 Å |
α | 97.589 ± 0.003° |
β | 93.469 ± 0.002° |
γ | 96.344 ± 0.002° |
Cell volume | 1853.2 ± 0.3 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0611 |
Residual factor for significantly intense reflections | 0.0453 |
Weighted residual factors for significantly intense reflections | 0.1058 |
Weighted residual factors for all reflections included in the refinement | 0.1122 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
Diffraction radiation wavelength | 0.7749 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7244210.html
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