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Information card for entry 7244216
Preview
Coordinates | 7244216.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C10 H27 Cl3 Cr N5 O |
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Calculated formula | C10 H27 Cl3 Cr N5 O |
SMILES | [Cr]1234(Cl)[NH]5CC[NH]1CC[NH]2CC[NH]3CC[NH]4CC5.[Cl-].[Cl-].O |
Title of publication | Expanding and quantifying the crystal chemistry of the flexible ligand 15aneN5 |
Authors of publication | Shircliff, Anthony D.; Allbritton, Elisabeth M. A.; Davilla, Dustin J.; Gorbet, Michael-Joseph; Jones, Donald G.; Tresp, David S.; Allen, Michael B.; Shrestha, Alina; Burgess, Gwendolyn E.; Eze, John I.; Fernandez, Andrea T.; Ramirez, Daniel; Shoff, Kody J.; Crispin, Garet G.; Crone, Sarah B.; Flinn, Michael; Tran, Tien; Bryce, Darby S.; Bond, Abbagale L.; Shockey, Dylan W.; Oliver, Allen G.; Krause, Jeanette A.; Prior, Timothy J.; Hubin, Timothy J. |
Journal of publication | CrystEngComm |
Year of publication | 2022 |
Journal volume | 24 |
Journal issue | 6 |
Pages of publication | 1218 - 1236 |
a | 15.3816 ± 0.0011 Å |
b | 9.2277 ± 0.0011 Å |
c | 12.6805 ± 0.0011 Å |
α | 90° |
β | 113.079 ± 0.003° |
γ | 90° |
Cell volume | 1655.8 ± 0.3 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0355 |
Residual factor for significantly intense reflections | 0.0296 |
Weighted residual factors for significantly intense reflections | 0.0552 |
Weighted residual factors for all reflections included in the refinement | 0.057 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.7749 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7244216.html
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Users of the data should acknowledge the original authors of the
structural data.