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Information card for entry 7703506
Preview
Coordinates | 7703506.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H56 Cd Cl2 N6 O6 |
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Calculated formula | C46 H56 Cd Cl2 N6 O6 |
SMILES | [Cd]1234([O]=N(=O)O1)(ON(=O)=O)[N]1(CC[N]2(CC[N]3(CC[N]4(CC1)C/C=C/c1ccccc1)C/C=C/c1ccccc1)C/C=C/c1ccccc1)C/C=C/c1ccccc1.C(CCl)Cl |
Title of publication | Inclusion of alkyl nitriles by tetra-armed cyclens with styrylmethyl groups. |
Authors of publication | Ju, Huiyeong; Tenma, Honoka; Iwase, Miki; Lee, Eunji; Ikeda, Mari; Kuwahara, Shunsuke; Habata, Yoichi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 10 |
Pages of publication | 3112 - 3119 |
a | 18.948 ± 0.003 Å |
b | 26.442 ± 0.004 Å |
c | 9.008 ± 0.0013 Å |
α | 90° |
β | 91.789 ± 0.002° |
γ | 90° |
Cell volume | 4511 ± 1.2 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1172 |
Residual factor for significantly intense reflections | 0.0668 |
Weighted residual factors for significantly intense reflections | 0.1608 |
Weighted residual factors for all reflections included in the refinement | 0.2008 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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