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Information card for entry 7703507
Preview
Coordinates | 7703507.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H55 Ag F6 N5 P |
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Calculated formula | C46 H55 Ag F6 N5 P |
SMILES | [Ag]123([N]4(CC[N]1(CC[N]2(CC[N]3(CC4)C/C=C/c1ccccc1)C/C=C/c1ccccc1)C/C=C/c1ccccc1)C/C=C/c1ccccc1)[N]#CC.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Inclusion of alkyl nitriles by tetra-armed cyclens with styrylmethyl groups. |
Authors of publication | Ju, Huiyeong; Tenma, Honoka; Iwase, Miki; Lee, Eunji; Ikeda, Mari; Kuwahara, Shunsuke; Habata, Yoichi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 10 |
Pages of publication | 3112 - 3119 |
a | 9.8867 ± 0.0006 Å |
b | 43.59 ± 0.002 Å |
c | 10.084 ± 0.0006 Å |
α | 90° |
β | 91.9702 ± 0.0012° |
γ | 90° |
Cell volume | 4343.2 ± 0.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0678 |
Residual factor for significantly intense reflections | 0.0447 |
Weighted residual factors for significantly intense reflections | 0.0976 |
Weighted residual factors for all reflections included in the refinement | 0.116 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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