Information card for entry 7703705

Structure parameters

• Formula: C16 H38 N2 O2 Zn2
• Calculated formula: C16 H38 N2 O2 Zn2
• Title of publication: Synthesis and characterization of novel zinc precursors for ZnO thin film deposition by atomic layer deposition.
• Authors of publication: Han, Seong Ho; Agbenyeke, Raphael Edem; Lee, Ga Yeon; Park, Bo Keun; Kim, Chang Gyoun; Lee, Young Kuk; Son, Seung Uk; Chung, Taek-Mo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 14
• Pages of publication: 4306 - 4314
• a: 9.952 ± 0.005 Å
• b: 10.298 ± 0.005 Å
• c: 12.228 ± 0.006 Å
• α: 72.78 ± 0.02°
• β: 89.89 ± 0.03°
• γ: 63.71 ± 0.02°
• Cell volume: 1060.9 ± 0.9 ų
• Cell temperature: 100 ± 1 K
• Ambient diffraction temperature: 100 ± 1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0668
• Residual factor for significantly intense reflections: 0.043
• Weighted residual factors for significantly intense reflections: 0.0956
• Weighted residual factors for all reflections included in the refinement: 0.1049
• Goodness-of-fit parameter for all reflections included in the refinement: 0.943
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No