Information card for entry 7703863

Structure parameters

• Formula: C35 H55 O2 P Si2 W
• Calculated formula: C35 H55 O2 P Si2 W
• SMILES: [W]12345([P](C)(C)C)(O[Si](O1)(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C)(#C[Si](C)(C)C)[c]1([c]3([c]4([c]5([c]21C)C)C)C)C
• Title of publication: Synthesis, structure, and reactivity of a pyridine-stabilized silanonetungsten complex.
• Authors of publication: Muraoka, Takako; Tsuchimoto, Masato; Ueno, Keiji
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 16
• Pages of publication: 5100 - 5107
• a: 41.02 ± 0.005 Å
• b: 10.8934 ± 0.0011 Å
• c: 16.974 ± 0.0019 Å
• α: 90°
• β: 107.113 ± 0.002°
• γ: 90°
• Cell volume: 7249 ± 1.4 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 6
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0273
• Residual factor for significantly intense reflections: 0.0256
• Weighted residual factors for significantly intense reflections: 0.0692
• Weighted residual factors for all reflections included in the refinement: 0.0696
• Goodness-of-fit parameter for all reflections included in the refinement: 1.159
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No