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Information card for entry 7707934
Preview
Coordinates | 7707934.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H51 F3 O3 P Rh S Si2 |
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Calculated formula | C39 H51 F3 O3 P Rh S Si2 |
SMILES | [Rh]12([P](c3c(C[Si]1(C(C)C)C(C)C)cccc3)(c1ccccc1)c1ccccc1C[Si]2(C(C)C)C(C)C)OS(=O)(=O)C(F)(F)F.c1ccccc1 |
Title of publication | 14-Electron Rh and Ir silylphosphine complexes and their catalytic activity in alkene functionalization with hydrosilanes. |
Authors of publication | Abeynayake, Niroshani S.; Zamora-Moreno, Julio; Gorla, Saidulu; Donnadieu, Bruno; Muñoz-Hernández, Miguel A; Montiel-Palma, Virginia |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2021 |
Journal volume | 50 |
Journal issue | 34 |
Pages of publication | 11783 - 11792 |
a | 11.7311 ± 0.0008 Å |
b | 21.7488 ± 0.0015 Å |
c | 15.5316 ± 0.0011 Å |
α | 90° |
β | 93.067 ± 0.002° |
γ | 90° |
Cell volume | 3957 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0369 |
Residual factor for significantly intense reflections | 0.036 |
Weighted residual factors for significantly intense reflections | 0.0955 |
Weighted residual factors for all reflections included in the refinement | 0.0968 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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