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Information card for entry 7709849
Preview
Coordinates | 7709849.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49 H63 Cd3 I2 N5 O9 |
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Calculated formula | C49 H63 Cd3 I2 N5 O9 |
SMILES | I[Cd]123[O]4[Cd]56789([O]%10[Cd]%11%12(I)[O]7c7c(C=[N]%11CC(C[N]%12=Cc%11c%10c([O]5CC)ccc%11)(C)C)cccc7[O]9CC)[O](CC)c5c4c(ccc5)C=[N]3CC(C[N]2=Cc2c([O]16)c([O]8CC)ccc2)(C)C.N(C)(C=O)C |
Title of publication | Insight into charge transportation in cadmium based semiconducting organic–inorganic hybrid materials and their application in the fabrication of photosensitive Schottky devices |
Authors of publication | Roy, Sourav; Dey, Arka; Gomila, Rosa M.; Ortega-Castro, Joaquin; Frontera, Antonio; Ray, Partha Pratim; Chattopadhyay, Shouvik |
Journal of publication | Dalton Transactions |
Year of publication | 2022 |
a | 11.792 ± 0.009 Å |
b | 14.624 ± 0.012 Å |
c | 16.775 ± 0.013 Å |
α | 92.589 ± 0.012° |
β | 103.555 ± 0.009° |
γ | 101.798 ± 0.01° |
Cell volume | 2740 ± 4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1338 |
Residual factor for significantly intense reflections | 0.0885 |
Weighted residual factors for significantly intense reflections | 0.2217 |
Weighted residual factors for all reflections included in the refinement | 0.2515 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7709849.html
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Users of the data should acknowledge the original authors of the
structural data.